用于低温高压测量的图案化砧座。

Patterned anvils for high pressure measurements at low temperature.

作者信息

Welzel Oliver P, Grosche F Malte

机构信息

Cavendish Laboratory, Department of Physics, University of Cambridge, J. J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom.

出版信息

Rev Sci Instrum. 2011 Mar;82(3):033901. doi: 10.1063/1.3541793.

DOI:10.1063/1.3541793

PMID:21456757

Abstract

Multiprobe high pressure measurements require electrical leads in the sample chamber. Compared to conventional wire-based techniques, metallic tracks patterned onto the anvil surface improve reliability and ease of use, and enable novel and more demanding measurements under high pressure. We have developed new anvil designs based on sputter-deposited tracks on alumina and moissanite anvils. These anvils allow convenient and reliable measurements of electrical transport properties or of the magnetic susceptibility under hydrostatic conditions, as demonstrated by test measurements on Pb and Ca(3)Ru(2)O(7).

摘要

多探针高压测量需要在样品腔中布置电引线。与传统的基于导线的技术相比，在砧座表面形成图案的金属轨道提高了可靠性和易用性，并能够在高压下进行新颖且要求更高的测量。我们基于在氧化铝和莫桑石砧座上溅射沉积的轨道开发了新的砧座设计。这些砧座能够在静水压力条件下方便且可靠地测量电输运性质或磁化率，对Pb和Ca(3)Ru(2)O(7)的测试测量证明了这一点。