Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction.

作者信息

Klein C, Nabbefeld T, Hattab H, Meyer D, Jnawali G, Kammler M, Meyer zu Heringdorf F-J, Golla-Franz A, Müller B H, Schmidt Th, Henzler M, Horn-von Hoegen M

机构信息

Department of Physics, Universität Duisburg-Essen, Lotharstr. 1, D-47057 Duisburg, Germany.

出版信息

Rev Sci Instrum. 2011 Mar;82(3):035111. doi: 10.1063/1.3554305.

DOI:10.1063/1.3554305

PMID:21456793

Abstract

The precise knowledge of the diffraction condition, i.e., the angle of incidence and electron energy, is crucial for the study of surface morphology through spot profile analysis low-energy electron diffraction (LEED). We demonstrate four different procedures to determine the diffraction condition: employing the distortion of the LEED pattern under large angles of incidence, the layer-by-layer growth oscillations during homoepitaxial growth, a G(S) analysis of a rough surface, and the intersection of facet rods with 3D Bragg conditions.

摘要