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纳米晶体光致电离概率的光谱依赖性:热载流子转移的作用。

Spectral dependence of nanocrystal photoionization probability: the role of hot-carrier transfer.

机构信息

Center for Advanced Solar Photophysics, C-PCS, Chemistry Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, United States.

出版信息

ACS Nano. 2011 Jun 28;5(6):5045-55. doi: 10.1021/nn201135k. Epub 2011 Jun 10.

DOI:10.1021/nn201135k
PMID:21591633
Abstract

We conduct measurements of photocharging of PbSe and PbS nanocrystal quantum dots (NQDs) as a function of excitation energy (ℏω). We observe a rapid growth of the degree of photocharging with increasing ℏω, which indicates an important role of hot-carrier transfer in the photoionization process. The corresponding spectral dependence exhibits two thresholds that mark the onsets of weak and strong photocharging. Interestingly, both thresholds are linked to the NQD band gap energy (E(g)) and scale as ∼1.5E(g) and ∼3E(g), indicating that the onsets of photoionization are associated with specific nanocrystal states (tentatively, 1P and 2P, respectively) and are not significantly dependent on the energy of external acceptor sites. For all samples, the hot-electron transfer probability increases by nearly 2 orders of magnitude as photon energy increases from 1.5 to 3.5 eV, although at any given wavelength the photoionization probability shows significant sample-to-sample variations (∼10(-6) to 10(-3) for 1.5 eV and ∼10(-4) to 10(-1) for 3.5 eV). In addition to the effect of the NQD size, these variations are likely due to differences in the properties of the NQD surface and/or the number and identity of external acceptor trap sites. The charge-separated states produced by photoionization are characterized by extremely long lifetimes (20 to 85 s) that become longer with increasing NQD size.

摘要

我们进行了 PbSe 和 PbS 纳米晶量子点(NQD)的光致充电测量,作为激发能量(ℏω)的函数。我们观察到光致充电程度随ℏω的增加而迅速增加,这表明热载流子转移在光致电离过程中起着重要作用。相应的光谱依赖性表现出两个阈值,标志着弱光充电和强光充电的开始。有趣的是,这两个阈值都与 NQD 带隙能量(E(g))有关,比例约为 1.5E(g)和 3E(g),表明光致电离的开始与特定的纳米晶态(暂定为 1P 和 2P)有关,而与外部接受体的能量无关。对于所有样品,随着光子能量从 1.5 到 3.5 eV 的增加,热电子转移概率增加了近两个数量级,尽管在任何给定的波长下,光致电离概率都显示出显著的样品间变化(对于 1.5 eV 为 10(-6)至 10(-3),对于 3.5 eV 为 10(-4)至 10(-1))。除了 NQD 尺寸的影响外,这些变化可能是由于 NQD 表面的性质以及外部接受体陷阱的数量和性质的差异所致。光致电离产生的电荷分离态具有极长的寿命(20 到 85 秒),随着 NQD 尺寸的增加而延长。

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