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采用极紫外光刻的消色差空间频率倍增法制作高分辨率菲涅尔波带片。

High-resolution Fresnel zone plate fabrication by achromatic spatial frequency multiplication with extreme ultraviolet radiation.

机构信息

Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, CH 5232 Villigen-PSI, Switzerland.

出版信息

Opt Lett. 2011 May 15;36(10):1860-2. doi: 10.1364/OL.36.001860.

Abstract

We used an approach based on the self-imaging property of gratings to fabricate high-resolution Fresnel zone plates (FZPs). Under certain conditions, the illumination of a parent ZP with a wideband EUV beam produces a radially oscillating intensity distribution with double the spatial frequency of the ZP. This intensity distribution is observed in a certain distance range, given by the local zone width, the focal length of the ZP, and the spectral bandwidth of the illuminating beam. This phenomenon has been used to lithographically record daughter ZPs that have approximately half the zone width, thus twice the resolution, of the parent ZP. FZPs with zone widths as low as 30 nm have been fabricated in this way. Use of this technique in the extreme ultraviolet (EUV) region has the potential for high throughput production of FZPs and similar high-resolution diffraction optics with variable spatial frequency for the EUV and x-ray regions.

摘要

我们采用了一种基于光栅自成像特性的方法来制造高分辨率菲涅尔波带片(FZP)。在某些条件下,用宽带极紫外(EUV)光束照射母 ZP 会产生空间频率是 ZP 的两倍的径向振荡强度分布。这种强度分布在一定的距离范围内观察到,该距离范围由局部波带宽度、ZP 的焦距和照明光束的光谱带宽决定。这种现象已被用于光刻记录子 ZP,其波带宽度约为母 ZP 的一半,因此分辨率提高了一倍。已经以这种方式制造出波带宽度低至 30nm 的 FZP。在极紫外(EUV)区域使用这种技术有可能实现 FZP 以及类似的高分辨率衍射光学元件的高通量生产,这些光学元件在 EUV 和 X 射线区域具有可变的空间频率。

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