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用于宽带极紫外和X射线成像的消色差菲涅耳光学器件。

Achromatic Fresnel optics for wideband extreme-ultraviolet and X-ray imaging.

作者信息

Wang Yuxin, Yun Wenbing, Jacobsen Chris

机构信息

Xradia, Inc., 4075A Sprig Drive, Concord, California 94520, USA.

出版信息

Nature. 2003 Jul 3;424(6944):50-3. doi: 10.1038/nature01756.

Abstract

Advances in extreme-ultraviolet (EUV) and X-ray optics are providing powerful new capabilities in high-resolution imaging and trace-element analysis of microscopic specimens, and the potential for fabricating devices of smaller critical dimensions in next-generation integrated circuit lithography. However, achieving the highest resolution with such optics usually requires the illuminating EUV or X-ray beam to be highly monochromatic. It would therefore be highly desirable to have large-field-of-view, sub-100-nm resolution optics that are achromatic to a significant degree, allowing more light to be utilized from broader bandwidth sources such as laser-produced plasmas. Here we report an achromatic Fresnel optical system for EUV or X-ray radiation that combines a Fresnel zone plate with a refractive lens with opposite chromatic aberration. We use the large anomalous dispersion property of the refractive lens material near an absorption edge to make its fabrication practical. The resulting structure can deliver a resolution comparable to that of the Fresnel zone plates that have achieved the highest resolution (25 nm; ref. 3) in the entire electromagnetic spectrum, but with an improvement of two or more orders of magnitude in spectral bandwidth.

摘要

极紫外(EUV)和X射线光学技术的进步为微观样本的高分辨率成像和微量元素分析提供了强大的新能力,并且在下一代集成电路光刻中具有制造更小关键尺寸器件的潜力。然而,使用此类光学器件实现最高分辨率通常需要照明的EUV或X射线光束具有高度单色性。因此,非常希望拥有大视场、分辨率低于100纳米且在很大程度上消色差的光学器件,以便能从更宽频带的光源(如激光产生的等离子体)中利用更多的光。在此,我们报道了一种用于EUV或X射线辐射的消色差菲涅耳光学系统,该系统将菲涅耳波带片与具有相反色差的折射透镜相结合。我们利用折射透镜材料在吸收边附近的大反常色散特性,使其制造变得可行。所得结构的分辨率可与在整个电磁频谱中实现最高分辨率(25纳米;参考文献3)的菲涅耳波带片相媲美,但光谱带宽提高了两个或更多数量级。

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