Liao Shirong, Feng Ning-Ning, Feng Dazeng, Dong Po, Shafiiha Roshanak, Kung Cheng-Chih, Liang Hong, Qian Wei, Liu Yong, Fong Joan, Cunningham John E, Luo Ying, Asghari Mehdi
Kotura Inc, 2630 Corporate Place, Monterey Park, CA 91754, USA.
Opt Express. 2011 May 23;19(11):10967-72. doi: 10.1364/OE.19.010967.
We present two effective approaches to improve the responsivity of high speed waveguide-based Ge photodetectors integrated on a 0.25 μm silicon-on-insulator (SOI) platform. The main cause of poor responsivity is identified as metal absorption from the top contact to Ge. By optimizing Ge thickness and offsetting the contact window, we have demonstrated that the responsivity can be improved from 0.6A/W to 0.95 A/W at 1550 nm with 36 GHz 3 dB bandwidth. We also demonstrate that a wider device with double offset contacts can achieve 1.05 A/W responsivity at 1550 nm and 20 GHz 3 dB bandwidth.
我们提出了两种有效的方法来提高集成在0.25μm绝缘体上硅(SOI)平台上的高速波导基锗光电探测器的响应度。响应度不佳的主要原因被确定为从顶部接触到锗的金属吸收。通过优化锗的厚度并偏移接触窗口,我们已经证明,在1550nm波长、36GHz 3dB带宽下,响应度可以从0.6A/W提高到0.95A/W。我们还证明,具有双偏移接触的更宽器件在1550nm波长、20GHz 3dB带宽下可以实现1.05A/W的响应度。