Kihara Toshiki
School of Science and Engineering, Kinki University, Kowakae 3-4-1, Higashiosaka 577-8502, Japan.
Appl Opt. 2011 Jun 10;50(17):2582-7. doi: 10.1364/AO.50.002582.
The Stokes parameters (S0, S1, S2, and S3) of monochromatic light can be measured using the adjustable azimuth settings of a quarter-wave plate and a polarizer. When measuring the Stokes parameters of light of an arbitrary wavelength, the measurement of S3 is affected by the phase difference error Δq(λi), due to the mismatch with respect to wavelength with the quarter-wave plate. In this method, Δq(λi), due to such a mismatch of incident light of arbitrary wavelength, can be overcome by a judicious choice of azimuth settings of the quarter-wave plate and the use of a polarizer; however, the use of a precision quarter-wave plate is necessary. The present paper proposes a measurement method of Stokes parameters of incident light of arbitrary wavelength using a quarter-wave plate with phase difference errors.
单色光的斯托克斯参数（S0、S1、S2和S3）可以通过四分之一波片和偏振器的可调方位角设置来测量。在测量任意波长光的斯托克斯参数时，由于与四分之一波片的波长不匹配，S3的测量会受到相位差误差Δq(λi)的影响。在这种方法中，通过明智地选择四分之一波片的方位角设置并使用偏振器，可以克服由于任意波长的入射光这种不匹配而产生的Δq(λi)；然而，需要使用精密的四分之一波片。本文提出了一种使用具有相位差误差的四分之一波片测量任意波长入射光斯托克斯参数的方法。
