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快照多波长双折射成像

Snapshot Multi-Wavelength Birefringence Imaging.

作者信息

Wang Shuang, Han Xie, Li Kewu

机构信息

School of Data Science and Technology, North University of China, Taiyuan 030051, China.

Engineering and Technology Research Center of Shanxi Province for Opto-Electric Information and Instrument, North University of China, Taiyuan 030051, China.

出版信息

Sensors (Basel). 2024 Aug 10;24(16):5174. doi: 10.3390/s24165174.

Abstract

A snapshot multi-wavelength birefringence imaging measurement method was proposed in this study. The RGB-LEDs at wavelengths 463 nm, 533 nm, and 629 nm were illuminated with circularly polarized light after passing through a circular polarizer. The transmitted light through the birefringent sample was captured by a color polarization camera. A single imaging process captured light intensity in four polarization directions (0°, 45°, 90°, and 135°) for each of the three RGB spectral wavelength channels, and subsequently measured the first three elements of Stokes vectors (, , and ) after the sample. The birefringence retardance and fast-axis azimuthal angle were determined simultaneously. An experimental setup was constructed, and polarization response matrices were calibrated for each spectral wavelength channel to ensure the accurate detection of Stokes vectors. A polymer true zero-order quarter-wave plate was employed to validate measurement accuracy and repeatability. Additionally, stress-induced birefringence in a PMMA arch-shaped workpiece was measured both before and after the application of force. Experimental results revealed that the repeatability of birefringence retardance and fast-axis azimuthal angle was better than 0.67 nm and 0.08°, respectively. This approach enables multispectral wavelength, high-speed, high-precision, and high-repeatability birefringence imaging measurements through a single imaging session.

摘要

本研究提出了一种快照多波长双折射成像测量方法。波长为463nm、533nm和629nm的RGB发光二极管在通过圆偏振器后用圆偏振光照射。通过双折射样品的透射光由彩色偏振相机捕获。单个成像过程在三个RGB光谱波长通道中的每一个通道中捕获四个偏振方向(0°、45°、90°和135°)的光强度,随后测量样品后斯托克斯矢量的前三个元素(、和)。同时确定双折射延迟和快轴方位角。构建了实验装置,并对每个光谱波长通道的偏振响应矩阵进行了校准,以确保斯托克斯矢量的准确检测。采用聚合物真零级四分之一波片来验证测量精度和重复性。此外,在施加力之前和之后测量了PMMA拱形工件中的应力诱导双折射。实验结果表明,双折射延迟和快轴方位角的重复性分别优于0.67nm和0.08°。这种方法能够通过单次成像实现多光谱波长、高速、高精度和高重复性的双折射成像测量。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4417/11359313/5f7e9ba4539d/sensors-24-05174-g001.jpg

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