Department of Physics, National University of Singapore, Singapore 117542, Singapore.
ACS Nano. 2011 Jul 26;5(7):5969-75. doi: 10.1021/nn201757j. Epub 2011 Jun 29.
Large-area patterning of epitaxial graphene for Schottky junction photodetectors has been demonstrated with a simple laser irradiation method. In this method, semimetal-semiconductor Schottky junctions are created in a controllable pattern between epitaxial graphene (EG) and laser-modified epitaxial graphene (LEG). The zero-biased EG-LEG-EG photodetector exhibits a nanosecond and wavelength-independent photoresponse in a broad-band spectrum from ultraviolet (200 nm) through visible to infrared light (1064 nm), distinctively different from conventional photon detectors. An efficient external photoresponsivity (or efficiency) of ∼0.1 A·W(-1) is achieved with a biased interdigitated EG-LEG-EG photodetector. The fabrication method presented here opens a viable route to carbon optoelectronics for a fast and highly efficient photoconductive detector.
大面积图案化外延石墨烯用于肖特基结光电探测器已经通过一种简单的激光辐照方法得到了证明。在这种方法中,在外延石墨烯 (EG) 和激光改性外延石墨烯 (LEG) 之间以可控的图案形成半金属-半导体肖特基结。零偏压 EG-LEG-EG 光电探测器在从紫外 (200nm) 到可见到红外光 (1064nm) 的宽光谱范围内表现出纳秒级和波长无关的光响应,与传统光子探测器明显不同。具有交叉指状 EG-LEG-EG 光电探测器的偏置外光电响应率 (或效率) 约为 0.1 A·W(-1)。这里提出的制造方法为用于快速和高效光导探测器的碳光电开辟了可行的途径。