Cao Zhenhua, She Qianwei, Huang Yongli, Meng Xiangkang
National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, People's Republic of China.
Nanoscale Res Lett. 2011 Mar 1;6(1):186. doi: 10.1186/1556-276X-6-186.
Nanoindentation creep and loading rate change tests were employed to examine the rate sensitivity (m) and hardness of nanocrystalline tetragonal Ta films. Experimental results suggested that the m increased with the decrease of feature scale, such as grain size and indent depth. The magnitude of m is much less than the corresponding grain boundary (GB) sliding deformation with m of 0.5. Hardness softening behavior was observed for smaller grain size, which supports the GB sliding mechanism. The rate-controlling deformation was interpreted by the GB-mediated processes involving atomic diffusion and the generation of dislocation at GB.
采用纳米压痕蠕变和加载速率变化试验来研究纳米晶四方钽薄膜的速率敏感性(m)和硬度。实验结果表明,m随晶粒尺寸和压痕深度等特征尺度的减小而增加。m的值远小于相应的晶界(GB)滑动变形,后者的m为0.5。对于较小的晶粒尺寸,观察到硬度软化行为,这支持了晶界滑动机制。速率控制变形被解释为由涉及原子扩散和晶界处位错产生的晶界介导过程。