Forest Genetics and Forest Tree Breeding, Büsgen Institute, Georg-August University Göttingen, Büsgenweg 2, Göttingen, 37077, Germany.
Mutat Res. 2011 Oct 9;725(1-2):29-35. doi: 10.1016/j.mrgentox.2011.07.003. Epub 2011 Jul 18.
Ionizing radiation is a strong mutagenic factor and, accordingly, elevated mutation rates would be expected in plants exposed to high chronic or acute radiation after the Chernobyl accident in 1986. Somatic mutations were analyzed in pines (Pinus sylvestris L.) planted before and after the Chernobyl accident and in control material of the same origin planted in sites with natural radiation. Microsatellites (SSRs) and amplified fragment-length polymorphisms (AFLPs) were investigated. The mutation rates for microsatellites were estimated as 2.8 × 10(-4)-7.1 × 10(-4) per locus for different irradiated tree populations; no mutations were detected in the controls. In the case of AFLPs, the observed mutation rates were 3.74 × 10(-3) -3.99 × 10(-3) and 1.06 × 10(-3) per locus for contaminated and control areas, respectively. Thus a statistically highly significant three-fold increase in number of mutations was found by the use of AFLP markers, indicating that ionizing radiation causes strong DNA damage across the entire genome and that AFLPs may be the appropriate marker system for this kind of analysis.
电离辐射是一种很强的诱变因素，因此，在 1986 年切尔诺贝利事故后，暴露于高慢性或急性辐射下的植物，其突变率应该会升高。对在切尔诺贝利事故前后种植的松树（Pinus sylvestris L.）和相同起源的在具有天然辐射的地点种植的对照材料进行体细胞突变分析。研究了微卫星（SSR）和扩增片段长度多态性（AFLP）。不同辐射树木种群的微卫星突变率估计为每个位点 2.8×10(-4)-7.1×10(-4)；对照中未检测到突变。对于 AFLP，观察到的突变率分别为污染区和对照区的每个位点 3.74×10(-3)-3.99×10(-3)和 1.06×10(-3)。因此，使用 AFLP 标记发现突变数量呈统计学上显著的三倍增加，表明电离辐射会导致整个基因组的强烈 DNA 损伤，并且 AFLP 可能是这种分析的合适标记系统。
