Kimling J, Martens S, Nielsch K
Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, 20355 Hamburg, Germany.
Rev Sci Instrum. 2011 Jul;82(7):074903. doi: 10.1063/1.3606441.
1ω and 3ω methods are widely established transient measurement techniques for the characterization of thermal transport in bulk-materials, thin films, and 1D nano-objects. These methods are based on resistance oscillations of a heater caused by Joule-heating from a sinusoidal current at frequency 1ω which lead to changes in the 1ω voltage and produce a voltage component at 3ω. Although the usual formalism for analyzing the measurement data assumes an ideal current source, voltage-driven measurement setups are employed in many cases. In this context, we find that there has been lack of clarity if a correction generally has to be considered when analyzing the measurement data from voltage driven setups. In this work, Fourier-analysis is employed to show that a correction is not required for 1ω methods and for 3ω measurements that use common-mode-subtraction. Experimental results are presented for a line heater on a fused silica substrate with known thermal properties, and for an individual nickel wire with diameter of 150 nm.
1ω和3ω方法是广泛应用于表征块状材料、薄膜和一维纳米物体中热传输的瞬态测量技术。这些方法基于频率为1ω的正弦电流通过焦耳热引起的加热器电阻振荡，这会导致1ω电压发生变化并产生3ω的电压分量。尽管分析测量数据的常用形式假设为理想电流源，但在许多情况下仍采用电压驱动的测量装置。在此背景下，我们发现，在分析来自电压驱动装置的测量数据时，是否通常需要进行校正尚不清楚。在这项工作中，采用傅里叶分析表明，对于1ω方法和使用共模减法的3ω测量，不需要进行校正。给出了在具有已知热性能的熔融石英衬底上的线加热器以及直径为150 nm的单根镍线的实验结果。
