Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075, Singapore.
Opt Lett. 2011 Aug 1;36(15):2752-4. doi: 10.1364/OL.36.002752.
The traditional Shack-Hartmann wavefront sensing (SHWS) system measures the wavefront slope by calculating the centroid shift between the sample and a reference piece, and then the wavefront is reconstructed by a suitable iterative reconstruction method. Because of the necessity of a reference, many issues are brought up, which limit the system in most applications. This Letter proposes a reference-free wavefront sensing (RFWS) methodology, and an RFWS system is built up where wavefront slope changes are measured by introducing a lateral disturbance to the sampling aperture. By using Southwell reconstruction two times to process the measured data, the form of the wavefront at the sampling plane can be well reconstructed. A theoretical simulation platform of RFWS is established, and various surface forms are investigated. Practical measurements with two measurement systems-SHWS and our RFWS-are conducted, analyzed, and compared. All the simulation and measurement results prove and demonstrate the correctness and effectiveness of the method.
传统的 Shack-Hartmann 波前传感 (SHWS) 系统通过计算样本和参考片之间的质心偏移来测量波前斜率，然后通过合适的迭代重建方法来重建波前。由于需要参考，因此出现了许多问题，这些问题限制了该系统在大多数应用中的使用。本文提出了一种无参考波前传感 (RFWS) 方法，并建立了一个 RFWS 系统，通过在采样孔径上引入横向扰动来测量波前斜率变化。通过使用 Southwell 重建两次来处理测量数据，可以很好地重建采样平面上的波前形状。建立了 RFWS 的理论模拟平台，并对各种表面形状进行了研究。通过两个测量系统-SHWS 和我们的 RFWS-进行了实际测量、分析和比较。所有的模拟和测量结果都证明并验证了该方法的正确性和有效性。
