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垂直排列的双壁碳纳米管阵列的增强场发射特性。

Enhanced field emission properties of vertically aligned double-walled carbon nanotube arrays.

作者信息

Chen Guohai, Shin Dong Hoon, Iwasaki Takayuki, Kawarada Hiroshi, Lee Cheol Jin

机构信息

School of Electrical Engineering, Korea University, Seoul 136-713, Korea.

出版信息

Nanotechnology. 2008 Oct 15;19(41):415703. doi: 10.1088/0957-4484/19/41/415703. Epub 2008 Sep 4.

Abstract

Vertically aligned double-walled carbon nanotube (VA-DWCNT) arrays were synthesized by point-arc microwave plasma chemical vapor deposition on Cr/n-Si and SiO(2)/n-Si substrates. The outer tube diameters of VA-DWCNTs are in the range of 2.5-3.8 nm, and the average interlayer spacing is approximately 0.42 nm. The field emission properties of these VA-DWCNTs were studied. It was found that a VA-DWCNT array grown on a Cr/n-Si substrate had better field emission properties as compared with a VA-DWCNT array grown on a SiO(2)/n-Si substrate and randomly oriented DWCNTs, showing a turn-on field of about 0.85 V µm(-1) at the emission current density of 0.1 µA cm(-2) and a threshold field of 1.67 V µm(-1) at the emission current density of 1.0 mA cm(-2). The better field emission performance of the VA-DWCNT array was mainly attributed to the vertical alignment of DWCNTs on the Cr/n-Si substrate and the low contact resistance between CNTs and the Cr/n-Si substrate.

摘要

通过点弧微波等离子体化学气相沉积法在Cr/n-Si和SiO₂/n-Si衬底上合成了垂直排列的双壁碳纳米管(VA-DWCNT)阵列。VA-DWCNT的外管直径在2.5-3.8nm范围内,平均层间距约为0.42nm。研究了这些VA-DWCNT的场发射特性。结果发现,与生长在SiO₂/n-Si衬底上的VA-DWCNT阵列和随机取向的DWCNT相比,生长在Cr/n-Si衬底上的VA-DWCNT阵列具有更好的场发射特性,在发射电流密度为0.1µA cm⁻²时开启场约为0.85V µm⁻¹,在发射电流密度为1.0mA cm⁻²时阈值场为1.67V µm⁻¹。VA-DWCNT阵列更好的场发射性能主要归因于DWCNT在Cr/n-Si衬底上的垂直排列以及碳纳米管与Cr/n-Si衬底之间的低接触电阻。

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