Tessmer S H, Kuljanishvili I
Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824, USA.
Nanotechnology. 2008 Nov 5;19(44):445503. doi: 10.1088/0957-4484/19/44/445503. Epub 2008 Oct 2.
We have developed a modeling method suitable for analyzing single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.
