Institut Langevin, École Supérieure de Physique et de Chimie Industrielles de la ville de Paris (ESPCI Paris-Tech), CNRS UMR 7587, UPMC Université Paris 6, Paris, France.
Opt Lett. 2011 Sep 1;36(17):3332-4. doi: 10.1364/OL.36.003332.
We present a simple scheme to determine the diffusion properties of a thin slab of strongly scattering material by measuring the speckle contrast resulting from the transmission of a femtosecond pulse with controlled bandwidth. In contrast with previous methods, our scheme does not require time measurements nor interferometry. It is well adapted to the characterization of samples for pulse shaping, nonlinear excitation through scattering media, and biological imaging.
我们提出了一种简单的方案,通过测量具有受控带宽的飞秒脉冲传输产生的散斑对比度来确定强散射材料薄片的扩散特性。与以前的方法相比,我们的方案不需要时间测量也不需要干涉测量。它非常适合于脉冲整形、通过散射介质进行非线性激发以及生物成像等样品的特性描述。