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回音壁声学传感:介观薄膜的表征及扫描探针显微镜应用

Whispering-gallery acoustic sensing: characterization of mesoscopic films and scanning probe microscopy applications.

作者信息

La Rosa Andres H, Li Nan, Fernandez Rodolfo, Wang Xiaohua, Nordstrom Richard, Padigi S K

机构信息

Physics Department, Portland State University, P.O. Box 751, Portland, Oregon 97207, USA.

出版信息

Rev Sci Instrum. 2011 Sep;82(9):093704. doi: 10.1063/1.3635224.

DOI:10.1063/1.3635224
PMID:21974591
Abstract

Full understanding of the physics underlying the striking changes in viscoelasticity, relaxation time, and phase transitions that mesoscopic fluid-like films undergo at solid-liquid interfaces, or under confinement between two sliding solid boundaries, constitutes one of the major challenges in condensed matter physics. Their role in the imaging process of solid substrates by scanning probe microscopy (SPM) is also currently controversial. Aiming at improving the reliability and versatility of instrumentation dedicated to characterize mesoscopic films, a noninvasive whispering-gallery acoustic sensing (WGAS) technique is introduced; its application as feedback control in SPM is also demonstrated. To illustrate its working principle and potential merits, WGAS has been integrated into a SPM that uses a sharp tip attached to an electrically driven 32-kHz piezoelectric tuning fork (TF), the latter also tighten to the operating microscope's frame. Such TF-based SPMs typically monitor the TF's state of motion by electrical means, hence subjected to the effects caused by the inherent capacitance of the device (i.e., electrical resonance differing from the probe's mechanical resonance). Instead, the novelty of WGAS resides in exploiting the already existent microscope's frame as an acoustic cavity (its few centimeter-sized perimeter closely matching the operating acoustic wavelength) where standing-waves (generated by the nanometer-sized oscillations of the TF's tines) are sensitively detected by an acoustic transducer (the latter judiciously placed around the microscope's frame perimeter for attaining maximum detection). This way, WGAS is able to remote monitoring, via acoustic means, the nanometer-sized amplitude motion of the TF's tines. (This remote-detection method resembles the ability to hear faint, but still clear, levels of sound at the galleries of a cathedral, despite the extraordinary distance location of the sound source.) In applications aiming at characterizing the dynamics of fluid-like mesoscopic films trapped under shear between the TF probe and the solid substrate, WGAS capitalizes on the well-known fact that the TF's motion is sensitively affected by the shear-forces (the substrate and its adsorbed mesocopic film playing a role) exert on its tip, which occurs when the latter is placed in close proximity to a solid substrate. Thus, WGAS uses a TF as an efficient transducer sandwiched between (i) the probe (that interact with the substrate and mesoscopic film), and (ii) the acoustic cavity (where an assessment of the probe mechanical motion is obtained). In short, WGAS has capability for monitoring probe-sample shear-force interactions via remote acoustic sensing means. In another application, WGAS can also be used as feedback control of the probe's vertical position in SPM. In effect, it is observed that when the microscope's probe stylus approaches a sample, a monotonic change of the WGAS acoustic signal occurs in the last ~20 nm before the probe touches the solid sample's surface, which allows implementing an automated-control of the probe-sample distance for safely scanning the tip across the sample surface. This principle is demonstrated by imaging the topographic features of a standard sample. Finally, it is worth to highlight that this alignment-free acoustic-based method offers a very direct assessment of the probe's mechanical motion state (the mechanical and the WGAS acoustic frequency responses coincide), which makes the WGAS a convenient metrology tool for studying surface interactions, including interfacial friction at the nanometer scale.

摘要

充分理解介观流体状薄膜在固液界面处或在两个滑动固体边界之间的限制下所经历的粘弹性、弛豫时间和相变等显著变化背后的物理原理,是凝聚态物理中的主要挑战之一。它们在扫描探针显微镜(SPM)对固体基板的成像过程中的作用目前也存在争议。为了提高用于表征介观薄膜的仪器的可靠性和通用性,引入了一种非侵入式回音壁声学传感(WGAS)技术;还展示了其在SPM中作为反馈控制的应用。为了说明其工作原理和潜在优点,WGAS已被集成到一个SPM中,该SPM使用一个连接到电驱动的32 kHz压电音叉(TF)的尖锐尖端,后者也固定在操作显微镜的框架上。这种基于TF的SPM通常通过电学方法监测TF的运动状态,因此会受到设备固有电容所引起的影响(即电共振与探针的机械共振不同)。相反,WGAS的新颖之处在于利用现有的显微镜框架作为声学腔(其几厘米大小的周长与工作声学波长紧密匹配),在其中由TF叉齿的纳米级振荡产生的驻波被一个声学换能器灵敏地检测到(后者明智地放置在显微镜框架周边以实现最大检测)。通过这种方式,WGAS能够通过声学手段远程监测TF叉齿的纳米级振幅运动。(这种远程检测方法类似于尽管声源位置非常远,但仍能在大教堂的回廊中听到微弱但仍清晰的声音水平的能力。)在旨在表征被困在TF探针和固体基板之间剪切作用下的流体状介观薄膜动力学的应用中,WGAS利用了一个众所周知的事实,即TF的运动受到施加在其尖端的剪切力(基板及其吸附的介观薄膜起作用)的灵敏影响,当后者靠近固体基板放置时就会发生这种情况。因此,WGAS使用TF作为一个高效的换能器,夹在(i)与基板和介观薄膜相互作用的探针,和(ii)获得探针机械运动评估的声学腔之间。简而言之,WGAS有能力通过远程声学传感手段监测探针 - 样品剪切力相互作用。在另一个应用中,WGAS也可以用作SPM中探针垂直位置的反馈控制。实际上,可以观察到当显微镜的探针触针接近样品时,在探针接触固体样品表面之前的最后约20 nm内,WGAS声学信号会发生单调变化,这允许实现对探针 - 样品距离的自动控制,以便安全地在样品表面扫描尖端。通过对标准样品的地形特征进行成像证明了这一原理。最后,值得强调的是,这种基于声学的无需对准的方法提供了对探针机械运动状态的非常直接的评估(机械和WGAS声学频率响应一致),这使得WGAS成为研究表面相互作用,包括纳米级界面摩擦的方便计量工具。

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