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利用自动化电子衍射断层扫描数据进行结构解析:不同的仪器方法。

Structure solution with automated electron diffraction tomography data: different instrumental approaches.

机构信息

Institute of Physical Chemistry, Johannes Gutenberg-Universität Mainz, Jakob Welderweg 11, 55128 Mainz.

出版信息

J Microsc. 2011 Dec;244(3):325-31. doi: 10.1111/j.1365-2818.2011.03550.x. Epub 2011 Oct 12.

DOI:10.1111/j.1365-2818.2011.03550.x
PMID:21992494
Abstract

Over the past few years automated electron diffraction tomography has become an established technique for structure solution of nano-crystalline material. The intentional choice of an arbitrary tilt axis and thus, the use of nonoriented diffraction patterns (off-zone acquisition) together with fine equidistant sampling of the reciprocal space result in high quality intensity data sets. Coupling automated electron diffraction tomography with electron beam precession (Vincent & Midgley, 1994) enables sampling of intensities between the static slices of reciprocal space and therefore enhances the quality of intensity data further; relatively complex structures have been solved using 3D electron diffraction intensities extracted from automated electron diffraction tomography data. Automated electron diffraction tomography data was collected initially using a dedicated automated module. In this manuscript we demonstrate that electron diffraction data of comparable quality can be collected using manual technique that mimics the automated process. A rather difficult material, i.e. a low symmetric (triclinic) sodium tetratungstate (Na(2) W(4) O(13) ) including heavy and light scatterers, was selected for testing. In this paper we show, that all collected data sets - automatic and manual, with and without electron beam precession - were able to provide data slightly different but suitable for ab initio structure solution and refinement.

摘要

在过去的几年中,自动化电子衍射断层扫描已成为纳米晶体材料结构解析的一种成熟技术。通过有意选择任意倾斜轴,以及使用非定向衍射图案(离轴采集)和倒易空间的精细等距采样,可获得高质量的强度数据集。将自动化电子衍射断层扫描与电子束进动(Vincent 和 Midgley,1994)相结合,可以在倒易空间的静态切片之间采集强度,从而进一步提高强度数据的质量;使用从自动化电子衍射断层扫描数据中提取的 3D 电子衍射强度,已经解决了相对复杂的结构。最初使用专用的自动化模块收集自动化电子衍射断层扫描数据。在本文中,我们证明了可以使用模拟自动化过程的手动技术来收集具有相当质量的电子衍射数据。选择了一种相当困难的材料,即低对称(斜方晶系)四钨酸钠(Na2W4O13),其中包含重散射体和轻散射体,用于测试。在本文中,我们表明,所有收集的数据组——自动和手动,带或不带电子束进动——都能够提供略有不同但适合从头算结构解析和精修的数据。

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