National Synchrotron Light Source II, Brookhaven National Laboratory, USA.
J Synchrotron Radiat. 2011 Nov;18(Pt 6):862-70. doi: 10.1107/S0909049511031098. Epub 2011 Sep 16.
Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.
介绍了一种 L 形侧向渐变多层镜的特性和测试。该反射镜设计为国家同步辐射光源 II（NSLS-II）超高分辨率非弹性 X 射线散射（IXS）光谱仪分析器系统的二维准直光学元件。其特性包括点对点反射率测量、晶格参数确定和反射镜计量（形貌、斜率误差和粗糙度）。该反射镜的同步加速器 X 射线测试是作为聚焦装置进行的。结果表明，L 形侧向渐变多层镜非常适合用于 NSLS-II 的 IXS 光谱仪分析器系统，具有高效率。
