通过电化学蚀刻和超高真空处理进行精细的针尖制备，以获得用于扫描隧道显微镜和原子力显微镜的原子级尖锐针尖。

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

作者信息

Hagedorn Till, El Ouali Mehdi, Paul William, Oliver David, Miyahara Yoichi, Grütter Peter

机构信息

Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8, Canada.

出版信息

Rev Sci Instrum. 2011 Nov;82(11):113903. doi: 10.1063/1.3660279.

DOI:10.1063/1.3660279

PMID:22128992

Abstract

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

摘要

本文介绍了一种对常见电化学蚀刻装置的改进方法。所描述的方法能够可重复地制备出尖锐的钨尖，用于扫描隧道显微镜和音叉原子力显微镜。文中描述了在超高真空（p≤10⁻¹⁰ 毫巴）条件下进行原位处理，以实现清洁和精细锐化，同时使钝化作最小化。这些尖端微观顶点的结构通过场离子显微镜进行原子级分辨，并通过场发射进行交叉验证。