Department of Physics, McGill University, Montreal, H3A 2T8, Canada.
Nanotechnology. 2012 Jan 20;23(2):025503. doi: 10.1088/0957-4484/23/2/025503. Epub 2011 Dec 14.
In atomic force microscopy, cantilevers with a reflective coating are often used to reduce optical shot noise for deflection detection. However, static AFM experiments can be limited by classical noise and therefore may not benefit from a reduction in shot noise. Furthermore, the cantilever coating has the detrimental side-effect of coupling light power fluctuations into true cantilever bending caused by time-varying thermal stresses. Here, we distinguish three classes of noise: detection, force, and displacement noise. We discuss these noises with respect to cantilever coating in the context of both static and dynamic AFM experiments. Finally, we present a patterned cantilever coating which reduces the impact of these noises.
在原子力显微镜中，通常使用带有反射涂层的悬臂梁来减少用于挠度检测的光学散粒噪声。然而，静态 AFM 实验可能会受到经典噪声的限制，因此可能不会受益于散粒噪声的降低。此外，悬臂梁涂层具有将光功率波动耦合到由时变热应力引起的真实悬臂梁弯曲的有害副作用。在这里，我们区分了三类噪声：检测噪声、力噪声和位移噪声。我们在静态和动态 AFM 实验的背景下讨论了这些噪声与悬臂梁涂层的关系。最后，我们提出了一种图案化的悬臂梁涂层，它可以降低这些噪声的影响。
