Japan Synchrotron Radiation Research Institute (JASRI), Sayo-gun, Hyogo, Japan.
J Synchrotron Radiat. 2012 Jan;19(Pt 1):54-9. doi: 10.1107/S0909049511042518. Epub 2011 Nov 15.
A novel XAFS measurement system has been developed in which XAFS measurements can be performed including sample-loading and detector adjustments. With this system, XAFS measurements of up to 80 samples in both transmission and fluorescence modes can be carried out. The adjustment of the optical components has also been automated. It not only saves manpower and measurement time, but also improves the accuracy and reliability of sample alignments.
一种新型的 XAFS 测量系统已经开发出来,该系统可以进行包括样品加载和探测器调整在内的 XAFS 测量。使用该系统,可以在透射和荧光两种模式下对多达 80 个样品进行 XAFS 测量。光学元件的调整也已实现自动化。它不仅节省了人力和测量时间,而且还提高了样品对准的准确性和可靠性。