School of Physics, University of Melbourne, Melbourne, Australia.
J Synchrotron Radiat. 2012 Nov;19(Pt 6):851-62. doi: 10.1107/S0909049512039544. Epub 2012 Oct 18.
This paper explains how to take the counting precision available for XAFS (X-ray absorption fine structure) and attenuation measurements, of perhaps one part in 10(6) in special cases, to produce a local variance below 0.01% and an accuracy of attenuation of the order 0.01%, with an XAFS accuracy at a similar level leading to the determination of dynamical bond lengths to an accuracy similar to that obtained by standard and experienced crystallographic measurements. This includes the necessary corrections for the detector response to be linear, including a correction for dark current and air-path energy dependencies; a proper interpretation of the range of sample thicknesses for absorption experiments; developments of methods to measure and correct for harmonic contamination, especially at lower energies without mirrors; the significance of correcting for the actual bandwidth of the beam on target after monochromation, especially for the portability of results and edge structure from one beamline to another; definitions of precision, accuracy and XAFS accuracy suitable for theoretical model analysis; the role of additional and alternative high-accuracy procedures; and discusses some principles regarding data formats for XAFS and for the deposition of data sets with manuscripts or to a database. Increasingly, the insight of X-ray absorption and the standard of accuracy needed requires data with high intrinsic precision and therefore with allowance for a range of small but significant systematic effects. This is always crucial for absolute measurements of absorption, and is of equal importance but traditionally difficult for (usually relative) measurements of fluorescence XAFS or even absorption XAFS. Robust error analysis is crucial so that the significance of conclusions can be tested within the uncertainties of the measurements. Errors should not just include precision uncertainty but should attempt to include estimation of the most significant systematic error contributions to the results. This is essential if the results are to be subject to deposition in a central accessible reference database; it is also crucial for specifying a standard data format for portability and ease of use by depositors and users. In particular this will allow development of theoretical formulations to better serve the world-wide XAFS community, and a higher and more easily comparable standard of manuscripts.
本文介绍了如何利用 XAFS(X 射线吸收精细结构)和衰减测量的可用计数精度,在特殊情况下达到 10 的负 6 次方分之一的局部方差和 0.01%的衰减精度,同时确保 XAFS 精度达到类似水平,从而以类似于标准和经验丰富的晶体学测量所获得的精度来确定动态键长。这包括对探测器响应进行线性化的必要校正,包括对暗电流和空气路径能量依赖性的校正;适当解释吸收实验中样品厚度的范围;开发方法来测量和校正谐波污染,特别是在没有镜子的较低能量下;校正单色化后实际光束在目标上的带宽的重要性,特别是对于结果和边缘结构在不同光束线之间的便携性;适用于理论模型分析的精度、准确性和 XAFS 精度的定义;额外和替代高精度程序的作用;并讨论了有关 XAFS 数据格式和数据集的存储与提交的一些原则。X 射线吸收的深入了解和所需的精度标准越来越需要具有高固有精度的数据,因此需要考虑一系列较小但具有重要意义的系统效应。这对于吸收的绝对测量始终是至关重要的,对于荧光 XAFS 甚至吸收 XAFS 的(通常是相对)测量同样重要,但传统上具有挑战性。稳健的误差分析至关重要,以便可以在测量不确定性的范围内测试结论的重要性。误差不仅应包括精度不确定性,而且还应尝试包括对结果产生最大影响的系统误差的估计。如果要将结果存入中央可访问的参考数据库,则这是必不可少的;对于指定可移植性和便于存储库和用户使用的标准数据格式也至关重要。特别是,这将允许开发更好地为全球 XAFS 社区服务的理论公式,并提高和更容易比较的手稿标准。