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在金上生成和验证原始的半氟化硫醇单层。

The production and verification of pristine semi-fluorinated thiol monolayers on gold.

机构信息

School of Chemistry and Molecular Biosciences, The University of Queensland, St. Lucia, QLD 4072, Australia.

出版信息

J Colloid Interface Sci. 2012 Mar 15;370(1):162-9. doi: 10.1016/j.jcis.2011.10.081. Epub 2011 Dec 6.

Abstract

The presence of adventitious contamination of self-assembled monolayers (SAMs) is a well-known phenomenon that is often overlooked or underestimated in the literature. Herein, we demonstrate that it is possible to produce pristine self-assembled monolayers (SAMs) on gold surfaces that are devoid of adventitious species. The chemical purity or the pristine quality of the SAM was verified by the experimental relative atomic ratios measured by X-ray photoelectron spectroscopy (XPS) of all elements including carbon and corresponded to within 5% of the stoichiometric ratios. Perfluoro-octyl-thiolate (F8) was used as a model compound in this study, where monolayers were assembled from solutions of an acetylated F8 precursor. Quantitative elemental characterization of the acetylated F8 precursor by cold-stage XPS provided valuable reference data for the analysis of the subsequent SAMs. Comprehensive analysis of high-resolution XPS C 1s spectra proved to be essential for establishing the purity of the SAMs, since the peaks of the adventitious species were easily distinguished from those of the F8. Analyses of deliberately contaminated F8 SAMs showed that the adventitious species persisted during the process of self-assembly and therefore co-existed with the SAM in the interfacial region. The work also established that even a lengthy deposition time of 18 h was incapable of displacing the adventitious species present at the interface.

摘要

自组装单分子层(SAM)中存在外来杂质污染是一个众所周知的现象,但在文献中经常被忽视或低估。在此,我们证明了在金表面上有可能制备出没有外来物种的原始自组装单分子层(SAM)。通过 X 射线光电子能谱(XPS)测量所有元素(包括碳)的实验相对原子比,证明了 SAM 的化学纯度或原始质量,其与化学计量比的偏差在 5%以内。在这项研究中,全氟辛基硫醇(F8)被用作模型化合物,其中单层是由乙酰化 F8 前体的溶液组装而成。冷台 XPS 对乙酰化 F8 前体的定量元素表征为后续 SAMs 的分析提供了有价值的参考数据。对高分辨率 XPS C 1s 光谱的综合分析对于证明 SAM 的纯度至关重要,因为可以很容易地将外来物种的峰与 F8 的峰区分开来。对故意污染的 F8 SAM 的分析表明,外来物种在自组装过程中仍然存在,因此与 SAM 在界面区域共存。该工作还表明,即使长达 18 小时的沉积时间也无法置换界面处存在的外来物种。

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