van Tilborg J, Bakker D J, Matlis N H, Leemans W P
Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA.
Opt Express. 2011 Dec 19;19(27):26634-44. doi: 10.1364/OE.19.026634.
Broad-bandwidth THz-domain electro-magnetic pulses are typically diagnosed through temporal electro-optic (EO) cross-correlation with an optical probe pulse. Single-shot time-domain measurements of the THz waveform involve complex setups at a bandwidth coverage limited by the probe bandwidth. Here we present an EO-based diagnostic directly in the spectral domain, relying on THz-induced optical sidebands on a narrow-bandwidth optical probe. Experiments are conducted with a 0.11-THz-bandwidth optical probe and a broadband source (0-8 THz detection bandwidth) rich in spectral features. The validity of the sideband diagnostic concept, its spectral resolution, sideband amplitude, and the effects of probe timing are studied. For probe pulses longer than the THz pulse, the sideband technique proves an accurate single-shot spectral diagnostic, with advantages in setup simplicity and bandwidth coverage no longer limited by the laser bandwidth.
宽带太赫兹时域电磁脉冲通常通过与光学探测脉冲的时间电光(EO)互相关来诊断。太赫兹波形的单次时域测量涉及复杂的设置,其带宽覆盖受探测带宽限制。在此,我们提出一种基于电光效应的直接在光谱域进行的诊断方法,该方法依赖于窄带光学探测上太赫兹诱导的光学边带。实验使用带宽为0.11太赫兹的光学探测和具有丰富光谱特征的宽带源(0 - 8太赫兹探测带宽)进行。研究了边带诊断概念的有效性、其光谱分辨率、边带幅度以及探测定时的影响。对于比太赫兹脉冲更长的探测脉冲,边带技术证明是一种准确的单次光谱诊断方法,在设置简单性和带宽覆盖方面具有优势,且不再受激光带宽限制。