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通过热量计监测的HfO₂薄膜上的激光处理。

Laser conditioning on HfO2 film monitored by calorimeter.

作者信息

Hao Liu, Songlin Chen, Yaowei Wei, Zhe Zhang, Jin Luo, Nan Zheng, Ping Ma

机构信息

Chengdu Fine Optical Engineering Research Center, 3# Keyuan 1st road, Chengdu, Sichuan, 610041, China.

出版信息

Opt Express. 2012 Jan 2;20(1):698-705. doi: 10.1364/OE.20.000698.

Abstract

Conditioning effect on HfO2 single-layer film by quasi-cw laser was investigated. The conditioning process was monitored with laser calorimeter. Experimental results revealed that the HfO2 film absorption decreased as a function of the irradiation dose. Higher laser power accelerated the conditioning process. The conditioning effect could not be explained by water annihilation. AFM pictures of the film surface showed that the structural information in the conditioned region was different from the unconditioned region. Monitoring the in situ absorption, laser calorimeter is a promising tool to investigate the laser conditioning process.

摘要

研究了准连续激光对HfO₂单层膜的激光预处理效应。用激光量热计监测预处理过程。实验结果表明,HfO₂膜的吸收率随辐照剂量的增加而降低。较高的激光功率加速了预处理过程。预处理效应不能用水的湮灭来解释。膜表面的原子力显微镜图像表明,预处理区域的结构信息与未处理区域不同。监测原位吸收率,激光量热计是研究激光预处理过程的一种很有前途的工具。

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