Vivien Laurent, Polzer Andreas, Marris-Morini Delphine, Osmond Johann, Hartmann Jean Michel, Crozat Paul, Cassan Eric, Kopp Christophe, Zimmermann Horst, Fédéli Jean Marc
Institut d’Electronique Fondamentale (IEF), Université Paris-Sud, CNRS, Orsay France.
Opt Express. 2012 Jan 16;20(2):1096-101. doi: 10.1364/OE.20.001096.
We report on lateral pin germanium photodetectors selectively grown at the end of silicon waveguides. A very high optical bandwidth, estimated up to 120GHz, was evidenced in 10 µm long Ge photodetectors using three kinds of experimental set-ups. In addition, a responsivity of 0.8 A/W at 1550 nm was measured. An open eye diagrams at 40Gb/s were demonstrated under zero-bias at a wavelength of 1.55 µm.
我们报道了在硅波导末端选择性生长的横向pin锗光电探测器。使用三种实验装置,在10μm长的锗光电探测器中证实了高达120GHz的非常高的光学带宽。此外,在1550nm处测得的响应度为0.8A/W。在1.55μm波长的零偏置下,展示了40Gb/s的睁眼眼图。