Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Microsc Microanal. 2012 Apr;18(2):336-42. doi: 10.1017/S1431927611012633. Epub 2012 Feb 14.
The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes.
在电子显微镜中使用的电荷耦合器件（CCD）涂有闪烁晶体，这会导致严重的调制传递函数（MTF）。对于图像模拟和实验之间的良好对应，准确了解 MTF 是至关重要的。我们提出了一种实用的方法，从电子束阻挡器的阴影图像中测量奈奎斯特频率以上的 MTF。图像处理已完全自动化，并公开了该程序。该方法已成功应用于具有不同电子束阻挡器形状的三种相机上。
