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利用透射 X 射线显微镜进行三维元素敏感成像。

3D elemental sensitive imaging using transmission X-ray microscopy.

机构信息

Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.

出版信息

Anal Bioanal Chem. 2012 Sep;404(5):1297-301. doi: 10.1007/s00216-012-5818-9. Epub 2012 Feb 19.

Abstract

Determination of the heterogeneous distribution of metals in alloy/battery/catalyst and biological materials is critical to fully characterize and/or evaluate the functionality of the materials. Using synchrotron-based transmission x-ray microscopy (TXM), it is now feasible to perform nanoscale-resolution imaging over a wide X-ray energy range covering the absorption edges of many elements; combining elemental sensitive imaging with determination of sample morphology. We present an efficient and reliable methodology to perform 3D elemental sensitive imaging with excellent sample penetration (tens of microns) using hard X-ray TXM. A sample of an Al-Si piston alloy is used to demonstrate the capability of the proposed method.

摘要

确定合金/电池/催化剂和生物材料中金属的不均匀分布对于充分表征和/或评估材料的功能至关重要。利用基于同步加速器的透射 X 射线显微镜(TXM),现在可以在涵盖许多元素吸收边的宽 X 射线能量范围内进行纳米分辨率成像;将元素敏感成像与样品形态的确定相结合。我们提出了一种高效可靠的方法,使用硬 X 射线 TXM 进行具有出色样品穿透能力(数十微米)的 3D 元素敏感成像。使用 Al-Si 活塞合金样品来证明所提出方法的能力。

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