Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
J Synchrotron Radiat. 2012 Sep;19(Pt 5):705-9. doi: 10.1107/S0909049512029640. Epub 2012 Jul 28.
Full-field transmission X-ray microscopy is a unique non-destructive technique for three-dimensional imaging of specimens at the nanometer scale. Here, the use of zone-doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X-ray regime (8-10 keV) is reported. By obtaining a tomographic reconstruction of a Ni/YSZ solid-oxide fuel cell, the feasibility of performing three-dimensional imaging of scientifically relevant samples using such high-spatial-resolution Fresnel zone plates is demonstrated.
全场透射 X 射线显微镜是一种独特的非破坏性技术,可对纳米尺度的标本进行三维成像。本文报道了使用倍区菲涅耳波带片将硬 X 射线(8-10keV)的空间分辨率提高到 20nm 以下。通过对 Ni/YSZ 固体氧化物燃料电池的断层重建,证明了使用这种高空间分辨率菲涅耳波带片对科学相关样本进行三维成像的可行性。