Yun Hyo Geun, Kim Seung Hwan, Jeong Heung Sun, Kim Kyong Hon
Department of Physics, Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, South Korea.
Appl Opt. 2012 Feb 20;51(6):720-5. doi: 10.1364/AO.51.000720.
We propose a simple white-light interferometric method of measuring a one-dimensional rotation angle with use of an optical plane parallel plate of standard refractive index. The phase change of the interference pattern of the interferometer during the rotation of the flat plate of known refractive index and thickness placed in one of the interferometer's arms is used for determination of the rotation angle. This method has been demonstrated for an accurate angle measurement over the angle range from 0° to 40° within a maximum uncertainty of 0.057°.
我们提出了一种简单的白光干涉测量方法，用于测量一维旋转角度，该方法使用具有标准折射率的光学平行平板。通过放置在干涉仪其中一个臂中的已知折射率和厚度的平板旋转过程中，干涉仪干涉图样的相位变化来确定旋转角度。该方法已被证明可在0°至40°的角度范围内进行精确角度测量，最大不确定度为0.057°。
