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受缺陷控制的发光 n/p 型纯净和掺钆的 SnO2 纳米晶薄膜中的磁性。

Defect-driven magnetism in luminescent n/p-type pristine and Gd-substituted SnO2 nanocrystalline thin films.

机构信息

Department of Condensed Matter Physics and Material Sciences, S N Bose National Centre for Basic Sciences, Salt Lake City, Kolkata, India.

出版信息

ACS Appl Mater Interfaces. 2012 Apr;4(4):2048-56. doi: 10.1021/am300023a. Epub 2012 Mar 27.

DOI:10.1021/am300023a
PMID:22423973
Abstract

The effects of rare-earth-element Gd doping on the intrinsic magnetic ordering, photoluminescence, and electrical-conducting properties of the pristine SnO(2) nanocrystalline thin films fabricated by radio-frequency (RF) sputtering are investigated. The pristine SnO(2) thin film exhibits significant ferromagnetism while Gd doping results in an absence of intrinsic ferromagnetism. The presence of large amounts of singly ionized oxygen vacancies (V(O)(+)) is traced by photoluminescence spectroscopic analysis and they are found to be responsible for the observed ferromagnetism in pristine SnO(2) thin films. A significant reduction of oxygen vacancies is observed after Gd doping, and that might be insufficient to mediate long-range ferromagnetic ordering between V(O)(+) defects in a Gd-doped SnO(2) system. Although the associated magnetic moment is increased by 1 order of magnitude, because of the insertion of Gd(3+) ions, which have localized f-shell paramagnetic moment, there is no intrinsic FM ordering. Hall measurement reveals that the pure SnO(2) exhibits n-type behavior whereas Gd-doped SnO(2) films show the p-type conductivity with higher resistivity. The studies demonstrate that only structural defects such as V(O)(+) defects, not magnetic ions such as Gd(3+), are responsible for inducing ferromagnetism in SnO(2) thin films.

摘要

研究了射频(RF)溅射制备的原始 SnO(2)纳米晶薄膜中稀土元素 Gd 掺杂对其本征磁有序、光致发光和导电性能的影响。原始 SnO(2)薄膜表现出显著的铁磁性,而 Gd 掺杂导致本征铁磁性缺失。光致发光光谱分析表明,大量单电离氧空位(V(O)(+)存在,这是原始 SnO(2)薄膜中观察到铁磁性的原因。Gd 掺杂后发现 V(O)(+)空位大量减少,这可能不足以介导 Gd 掺杂 SnO(2)体系中 V(O)(+)缺陷之间的长程铁磁有序。尽管由于插入具有局域 f 壳层顺磁矩的 Gd(3+)离子,相关磁矩增加了 1 个数量级,但不存在本征 FM 有序。霍尔测量表明,纯 SnO(2)表现出 n 型行为,而 Gd 掺杂 SnO(2)薄膜表现出更高电阻率的 p 型导电性。研究表明,只有结构缺陷(如 V(O)(+)缺陷)而不是磁性离子(如 Gd(3+))负责诱导 SnO(2)薄膜中的铁磁性。

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