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原位透射电子显微镜纳米压痕法研究纳米颗粒。

In situ TEM nanoindentation of nanoparticles.

机构信息

Department of Materials Science and Engineering, Massachusetts Institute of Technology Cambridge, MA 02139, USA.

出版信息

Micron. 2012 Nov;43(11):1134-9. doi: 10.1016/j.micron.2012.03.002. Epub 2012 Mar 10.

Abstract

The deformation behavior of nanoparticles continues to be an exciting area for materials research. Typically, nanoparticles show a conspicuous lack of dislocations, even after significant deformation. Therefore, it has been suggested that dislocations cannot exist or/do not play a role on the deformation of nanoparticles. In situ TEM nanoindentation is a critical tool for addressing this issue because it allows for the deformation to be monitored in real time. In this article, we discuss some of the experimental needs and challenges for performing in situ nanoindentation TEM experiments on nanoparticles. In addition, we show both diffraction contrast and phase contrast in situ TEM nanoindentation experiments on silver nanoparticles with diameters below 50nm. Evidence of the presence of dislocations was observed during deformation, but upon unloading dislocations disappeared.

摘要

纳米粒子的变形行为仍然是材料研究的一个令人兴奋的领域。通常,纳米粒子在发生显著变形后仍明显缺乏位错。因此,有人提出位错不可能存在或/对位错在纳米粒子的变形中不起作用。原位 TEM 纳米压痕是解决这一问题的关键工具,因为它可以实时监测变形。在本文中,我们讨论了在纳米粒子上进行原位纳米压痕 TEM 实验的一些实验需求和挑战。此外,我们还展示了直径小于 50nm 的银纳米粒子的衍射对比度和相衬原位 TEM 纳米压痕实验。在变形过程中观察到了位错的存在,但在卸载时位错消失了。

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