Institut für Werkstoffe der Elektrotechnik II, RWTH Aachen University, Sommerfeldstraße 24, 52064 Aachen, Germany.
Nanoscale. 2012 May 21;4(10):3040-3. doi: 10.1039/c2nr30413a. Epub 2012 Apr 13.
The mobility of copper ions and redox reactions of Cu at the interface with SiO(2) being directly attributed to the resistive switching effect have been studied by cyclic voltammetry (CV). The electrode kinetics of the Cu(z+)/Cu redox reactions were analyzed suggesting the formation of both Cu(+) and Cu(2+) species. The ion mobility shows an unexpected strong dependence on the ion concentration indicating ion-ion interactions typical for concentrated solution conditions. Based on the standard reduction potentials for Cu(z+)/Cu we identified partial electrochemical redox reactions during oxidation and reduction. The results contribute to a detailed understanding of the resistive switching effect in Cu/SiO(2)/Pt cells and provide insight into electrochemically assisted diffusion of metal cations in oxides in general.
通过循环伏安法（CV）研究了与 SiO(2) 界面处铜离子的迁移率和 Cu 的氧化还原反应与电阻开关效应之间的直接关系。分析了 Cu(z+)/Cu 氧化还原反应的电极动力学，表明形成了 Cu(+)和 Cu(2+)两种物种。离子迁移率对离子浓度表现出出乎意料的强烈依赖性，表明存在典型的浓溶液条件下的离子-离子相互作用。基于 Cu(z+)/Cu 的标准还原电位，我们在氧化和还原过程中确定了部分电化学氧化还原反应。这些结果有助于深入了解 Cu/SiO(2)/Pt 电池中的电阻开关效应，并为一般氧化物中金属阳离子电化学辅助扩散提供了深入的了解。
