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无位错螺旋生长:拓扑绝缘体 Bi2Se3 在外延石墨烯/SiC(0001)上的分子束外延。

Spiral growth without dislocations: molecular beam epitaxy of the topological insulator Bi2Se3 on epitaxial graphene/SiC(0001).

机构信息

Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211, USA.

出版信息

Phys Rev Lett. 2012 Mar 16;108(11):115501. doi: 10.1103/PhysRevLett.108.115501. Epub 2012 Mar 14.

Abstract

We report a new mechanism that does not require the formation of interfacial dislocations to mediate spiral growth during molecular beam epitaxy of Bi2Se3. Based on in situ scanning tunneling microscopy observations, we find that Bi2Se3 growth on epitaxial graphene/SiC(0001) initiates with two-dimensional (2D) nucleation, and that the spiral growth ensues with the pinning of the 2D growth fronts at jagged steps of the substrate or at domain boundaries created during the coalescence of the 2D islands. Winding of the as-created growth fronts around these pinning centers leads to spirals. The mechanism can be broadly applied to the growth of other van der Waals materials on weakly interacting substrates. We further confirm, using scanning tunneling spectroscopy, that the one-dimensional helical mode of a line defect is not supported in strong topological insulators such as Bi2Se3.

摘要

我们报道了一种新的机制,它不需要形成界面位错来介导 Bi2Se3 的分子束外延中的螺旋生长。基于原位扫描隧道显微镜观察,我们发现 Bi2Se3 在外延石墨烯/SiC(0001)上的生长始于二维(2D)成核,并且螺旋生长伴随着 2D 生长前沿在基底的锯齿形台阶处或在 2D 岛的合并过程中形成的畴界处的钉扎。在这些钉扎中心周围创建的生长前沿的缠绕导致螺旋。该机制可广泛应用于其他范德华材料在弱相互作用衬底上的生长。我们还使用扫描隧道光谱学进一步证实,线缺陷的一维螺旋模式在 Bi2Se3 等强拓扑绝缘体中不受支持。

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