Liu Zhi, Cheng Buwen, Hu Weixuan, Su Shaojian, Li Chuanbo, Wang Qiming
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, QingHua East Road, Haidian District, Beijing, 100083, People's Republic of China.
Nanoscale Res Lett. 2012 Jul 11;7(1):383. doi: 10.1186/1556-276X-7-383.
Four-bilayer Ge quantum dots (QDs) with Si spacers were grown on Si(001) substrates by ultrahigh vacuum chemical vapor deposition. In three samples, all Ge QDs were grown at 520 °C, while Si spacers were grown at various temperatures (520 °C, 550 °C, and 580 °C). Enhancement and redshift of room temperature photoluminescence (PL) were observed from the samples in which Si spacers were grown at a higher temperature. The enhancement of PL is explained by higher effective electrons capturing in the larger size Ge QDs. Quantum confinement of the Ge QDs is responsible for the redshift of PL spectra. The Ge QDs' size and content were investigated by atomic force microscopy and Raman scattering measurements.
通过超高真空化学气相沉积法在Si(001)衬底上生长了带有Si间隔层的四层Ge量子点(QDs)。在三个样品中,所有的Ge量子点均在520°C下生长,而Si间隔层则在不同温度(520°C、550°C和580°C)下生长。在Si间隔层于较高温度下生长的样品中观察到室温光致发光(PL)增强和红移。PL增强是由较大尺寸Ge量子点中更高的有效电子俘获来解释的。Ge量子点的量子限制导致了PL光谱的红移。通过原子力显微镜和拉曼散射测量研究了Ge量子点的尺寸和含量。