通过偏最小二乘法对复杂基质液体进行直接快速能量色散X射线荧光（EDXRF）和散射分析的可行性。
Feasibility for direct rapid energy dispersive X-ray fluorescence (EDXRF) and scattering analysis of complex matrix liquids by partial least squares.
作者信息
Angeyo K H, Gari S, Mustapha A O, Mangala J M
机构信息
Applied Nuclear and Radiation Physics Group, Department of Physics, University of Nairobi, P.O. Box 30197-00100, Nairobi, Kenya.
出版信息
Appl Radiat Isot. 2012 Nov;70(11):2596-601. doi: 10.1016/j.apradiso.2012.07.019. Epub 2012 Aug 8.
The greatest challenge to material characterization by XRF technique is encountered in direct trace analysis of complex matrices. We exploited partial least squares (PLS) in conjunction with energy dispersive X-ray fluorescence and scattering (EDXRFS) spectrometry to rapidly (200 s) analyze lubricating oils. The PLS-EDXRFS method affords non-invasive quality assurance (QA) analysis of complex matrix liquids as it gave optimistic results for both heavy- and low-Z metal additives. Scatter peaks may further be used for QA characterization via the light elements.
X射线荧光（XRF）技术在材料表征方面面临的最大挑战在于复杂基体的直接痕量分析。我们利用偏最小二乘法（PLS）结合能量色散X射线荧光与散射（EDXRFS）光谱法，快速（200秒）分析润滑油。PLS - EDXRFS方法能够对复杂基体液体进行非侵入式质量保证（QA）分析，因为它对重元素和低原子序数（低Z）金属添加剂都给出了理想结果。散射峰还可通过轻元素用于QA表征。
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