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深入了解倍增散射校正参数中所包含的信息,以及从这些参数中估计颗粒大小的可能性。

Insights into information contained in multiplicative scatter correction parameters and the potential for estimating particle size from these parameters.

机构信息

Department of Chemical and Process Engineering, University of Strathclyde, Glasgow, United Kingdom.

出版信息

Anal Chim Acta. 2012 Oct 9;746:37-46. doi: 10.1016/j.aca.2012.08.006. Epub 2012 Aug 14.

Abstract

This paper investigates the nature of information contained in scatter correction parameters. The study had two objectives. The first objective was to examine the nature and extent of information contained in scatter correction parameters. The second objective is to examine whether this information can be effectively extracted by proposing a method to obtain particularly the mean particle diameter from the scatter correction parameters. By using a combination of experimental data and simulated data generated using fundamental light propagation theory, a deeper and more fundamental insight of what information is removed by the multiplicative scatter correction (MSC) method is obtained. It was found that the MSC parameters are strongly influenced not only by particle size but also by particle concentration as well as refractive index of the medium. The possibility of extracting particle size information in addition to particle concentration was considered by proposing a two-step method which was tested using a 2-component and 4-component data set. This method can in principle, be used in conjunction with any scatter correction technique provided that the scatter correction parameters exhibit a systematic dependence with respect to particle size and concentration. It was found that the approach which uses the MSC parameters gave a better estimate of the particle diameter compared to using partial least squares (PLS) regression for the 2-component data. For the 4 component data it was found that PLS regression gave better results but further examination indicated this was due to chance correlations of the particle diameter with the two of the absorbing species in the mixture.

摘要

本文研究了散射校正参数中所包含信息的本质。该研究有两个目的。第一个目的是检验散射校正参数中所包含信息的本质和程度。第二个目的是通过提出一种从散射校正参数中获取平均粒径的方法,来检验是否可以有效地提取这些信息。通过使用实验数据和基于基本光传播理论生成的模拟数据的组合,对乘法散射校正(MSC)方法所去除的信息有了更深入、更基本的了解。结果表明,MSC 参数不仅受粒径影响,还受颗粒浓度以及介质折射率的影响。通过提出两步法考虑了除颗粒浓度之外还可以提取粒径信息的可能性,并用 2 组分和 4 组分数据集进行了测试。只要散射校正参数表现出与粒径和浓度的系统依赖性,该方法就可以与任何散射校正技术结合使用。结果表明,对于 2 组分数据,与使用偏最小二乘法(PLS)回归相比,使用 MSC 参数的方法可以更好地估计粒径。对于 4 组分数据,发现 PLS 回归的结果更好,但进一步的检查表明,这是由于粒径与混合物中两种吸收物质之间的偶然相关性所致。

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