Suppr超能文献

B 和 P 掺杂剂在 Si/SiO2 核壳纳米线中的稳定性和分凝。

Stability and segregation of B and P dopants in Si/SiO2 core-shell nanowires.

机构信息

Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea.

出版信息

Nano Lett. 2012 Oct 10;12(10):5068-73. doi: 10.1021/nl3013924. Epub 2012 Sep 19.

Abstract

Using molecular dynamics simulations, we generate realistic atomic models for oxidized Si nanowires which consist of a crystalline Si core and an amorphous SiO(2) shell. The amorphous characteristics of SiO(2) are well reproduced, as compared to those for bulk amorphous silica. Based on first-principles density functional calculations, we investigate the stability and segregation of B and P dopants near the radial interface between Si and SiO(2). Although substitutional B atoms are more stable in the core than in the oxide, B dopants can segregate to the oxide with the aid of Si self-interstitials which are generated during thermal oxidation. The segregation of B dopants occurs in the form of B interstitials in the oxide, leaving the self-interstitials in the Si core. In the case of P dopants, dopant segregation to the oxide is unfavorable even in the presence of self-interstitials. Instead, we find that P dopants tend to aggregate in the Si region near the interface and may form nearest-neighbor donor pairs, which are energetically more stable than isolated P dopants.

摘要

利用分子动力学模拟,我们为氧化硅纳米线生成了逼真的原子模型,这些模型由晶态硅核和非晶态 SiO(2)壳层组成。与块状无定形二氧化硅相比,SiO(2)的非晶态特征得到了很好的再现。基于第一性原理密度泛函计算,我们研究了 B 和 P 掺杂剂在 Si 和 SiO(2)之间的径向界面附近的稳定性和偏析。尽管替位 B 原子在核中比在氧化物中更稳定,但在热氧化过程中产生的 Si 自间隙的帮助下,B 掺杂剂可以偏析到氧化物中。B 掺杂剂的偏析以氧化物中的 B 间隙形式发生,而自间隙则留在 Si 核中。对于 P 掺杂剂,即使存在自间隙,掺杂剂向氧化物的偏析也是不利的。相反,我们发现 P 掺杂剂倾向于在界面附近的 Si 区域聚集,并可能形成最近邻施主对,其能量比孤立的 P 掺杂剂更稳定。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验