NSF Nano-scale Science and Engineering Center (NSEC), 3112 Etcheverry Hall, University of California, Berkeley, California 94720, USA.
Opt Lett. 2012 Oct 1;37(19):4089-91. doi: 10.1364/OL.37.004089.
The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems.
明确确定超材料的光学折射率对于器件应用和新光学现象的研究是一项具有挑战性的任务。我们在这里展示了使用光谱和空间分辨干涉测量法对超材料进行简单的宽带相位测量。我们研究了一种已知为电磁感应透明模拟的π形超材料的相位响应。测量的宽带干涉图在单次测量中给出了超材料产生的相移或相前。所提出的技术提供了一种有效表征包括非线性和增益超材料系统的光学超材料的方法。
