Full-field optical coherence microscopy with Riesz transform-based demodulation for dynamic imaging.

We present dynamic full-field optical coherence microscope imaging using a scientific complementary metal oxide semiconductor camera in conjunction with a demodulation scheme based on the Riesz transform and monogenic signals. The potential of our approach is verified by a comparison with conventional phase-stepping as well as with an analytic reconstruction method and finally exemplified for dynamic mechanical testing of a polymer/fiber composite structure.