School of Pharmaceutical Sciences, University of Shizuoka, 52-1 Yada, Suruga-ku, Shizuoka 422-8526, Japan.
Int J Pharm. 2013 Mar 10;445(1-2):93-8. doi: 10.1016/j.ijpharm.2013.01.048. Epub 2013 Jan 31.
Computed tomography (CT) using synchrotron X-ray radiation was evaluated as a non-destructive structural analysis method for fine granules. Two kinds of granules have been investigated: a bromhexine hydrochloride (BHX)-layered Celphere CP-102 granule coated with pH-sensitive polymer Kollicoat Smartseal 30-D, and a wax-matrix granule constructed from acetaminophen (APAP), dibasic calcium phosphate dehydrate, and aminoalkyl methacrylate copolymer E (AMCE) manufactured by melt granulation. The diameters of both granules were 200-300 μm. CT analysis of CP-102 granule could visualize the laminar structures of BHX and Kollicoat layers, and also visualize the high talc-content regions in the Kollicoat layer that could not be detected by scanning electron microscopy. Moreover, CT analysis using X-ray energies above the absorption edge of Br specifically enhanced the contrast in the BHX layer. As for granules manufactured by melt granulation, CT analysis revealed that they had a small inner void space due to a uniform distribution of APAP and other excipients. The distribution of AMCE revealed by CT analysis was also found to involve in the differences of drug dissolution from the granules as described previously. These observations demonstrate that CT analysis using synchrotron X-ray radiation is a powerful method for the detailed internal structure analysis of fine granules.
利用同步加速器 X 射线的计算机断层扫描(CT)被评估为一种用于细颗粒的非破坏性结构分析方法。研究了两种颗粒:一种是用 pH 敏感聚合物 Kollicoat Smartseal 30-D 包衣的盐酸溴己新(BHX)层 Celphere CP-102 颗粒,另一种是由对乙酰氨基酚(APAP)、二水合磷酸氢钙和氨基烷基甲基丙烯酸酯共聚物 E(AMCE)制成的蜡基质颗粒通过熔融造粒。两种颗粒的直径均为 200-300μm。CP-102 颗粒的 CT 分析可以可视化 BHX 和 Kollicoat 层的层状结构,还可以可视化 Kollicoat 层中高滑石含量区域,这些区域无法通过扫描电子显微镜检测到。此外,使用 Br 吸收边缘以上的 X 射线能量进行 CT 分析可以特异性增强 BHX 层的对比度。对于通过熔融造粒制造的颗粒,CT 分析表明,由于 APAP 和其他赋形剂的均匀分布,它们具有较小的内部空隙空间。通过 CT 分析揭示的 AMCE 分布也被发现与先前描述的颗粒中药物溶解的差异有关。这些观察结果表明,利用同步加速器 X 射线的 CT 分析是一种用于细颗粒详细内部结构分析的强大方法。