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新生儿插管会导致早产儿乳牙出现缺陷。

The neonatal intubation causes defects in primary teeth of premature infants.

作者信息

Suely Falcao de Oliveira Melo Norma, Guimaraes Vieira Cavalcante da Silva Regina Paula, Adilson Soares de Lima Antonio

机构信息

Department of Stomatology, School of Dentistry, Universidade Federal do Parana - UFPR, Curitiba-PR, Brazil.

出版信息

Biomed Pap Med Fac Univ Palacky Olomouc Czech Repub. 2014 Dec;158(4):605-12. doi: 10.5507/bp.2013.004. Epub 2013 Feb 26.

Abstract

AIM

This study aimed to evaluate the relationship between intubation during the neonatal period and enamel defects in primary teeth of preterm infants. It was an observational, prospective, analytical and sampling of convenience. We selected 157 children who had average birth weight of 1656.3±627.8 g, gestational age of 31.7±2.7 weeks and the examination of chronological age 2.2±0.6 years old.

METHODS

Clinical examination of the oral cavity showed that the frequency of enamel defects was higher (86.3%) among children intubated when compared to non-intubated children (13.7%). The enamel defects was found to be inversely proportional to gestational age. The intubation time was related to the probability of occurrence of DDE (P<0.001), in other words, the greater the number of days intubated, the greater the chance of DDE. In children intubated, hypoplasia mainly affected the upper teeth on the left side of the mouth.

CONCLUSION

Tracheal intubation in the neonatal period is the main cause of enamel defects in primary teeth of children born preterm. The longer the duration of intubation, the greater the chance of developing dental enamel defect. The area of action during movement of the laryngoscope toggle corresponds to the region most affected by tooth enamel hypoplasia in children intubated, upper right central incisor, lateral incisor and upper left.

摘要

目的

本研究旨在评估新生儿期插管与早产儿乳牙釉质缺陷之间的关系。这是一项观察性、前瞻性、分析性和便利抽样研究。我们选取了157名儿童,他们的平均出生体重为1656.3±627.8克,胎龄为31.7±2.7周,实际年龄检查为2.2±0.6岁。

方法

口腔临床检查显示,插管儿童的釉质缺陷发生率较高(86.3%),而非插管儿童的发生率为(13.7%)。发现釉质缺陷与胎龄成反比。插管时间与发育性牙釉质缺陷(DDE)的发生概率相关(P<0.001),也就是说,插管天数越多,发生DDE的几率越大。在插管儿童中,发育不全主要影响口腔左侧的上牙。

结论

新生儿期气管插管是早产儿乳牙釉质缺陷的主要原因。插管时间越长,发生牙釉质缺陷的几率越大。喉镜拨钮移动时的作用区域与插管儿童牙釉质发育不全最常受影响的区域相对应,即右上中切牙、侧切牙和左上牙。

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