Rabiei Payam, Ma Jichi, Khan Saeed, Chiles Jeff, Fathpour Sasan
CREOL, The College of Optics and Photonics, University of Central Florida, USA.
Opt Express. 2013 Mar 25;21(6):6967-72. doi: 10.1364/OE.21.006967.
Submicron tantalum pentoxide ridge and channel optical waveguides and microring resonators are demonstrated on silicon substrates by selective oxidation of the refractory metal, tantalum. The novel method eliminates the surface roughness problem normally introduced during dry etching of waveguide sidewalls and also simplifies fabrication of directional couplers. It is shown that the measured propagation loss is independent of the waveguide structure and thereby limited by the material loss of tantalum pentoxide in waveguides core regions. The achieved microring resonators have cross-sectional dimensions of ~600 nm × ~500 nm, diameters as small as 80 µm with a quality, Q, factor of 4.5 × 10(4), and a finesse of 120.
通过对难熔金属钽进行选择性氧化,在硅衬底上展示了亚微米级五氧化二钽脊形和通道光波导以及微环谐振器。这种新方法消除了通常在波导侧壁干法蚀刻过程中引入的表面粗糙度问题,并且还简化了定向耦合器的制造。结果表明,测量得到的传播损耗与波导结构无关,因此受波导核心区域五氧化二钽的材料损耗限制。所实现的微环谐振器的横截面尺寸约为600纳米×约500纳米,直径小至80微米,品质因数Q为4.5×10⁴,精细度为120。