Li Jia, Liu Shiyuan, Lam Edmund Y
Imaging Systems Laboratory, Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, China.
Opt Express. 2013 Apr 8;21(7):8076-90. doi: 10.1364/OE.21.008076.
Source mask optimization (SMO) is a powerful and effective technique to obtain sufficient process stability in optical lithography, particularly in view of the challenges associated with 22 nm process technology and beyond. However, SMO algorithms generally involve computation-intensive nonlinear optimization. In this work, a fast algorithm based on augmented Lagrangian methods (ALMs) is developed for solving SMO. We first convert the optimization to an equivalent problem with constraints using variable splitting, and then apply an alternating minimization method which gives a straightforward implementation of the algorithm. We also use the quasi-Newton method to tackle the sub-problem so as to accelerate convergence, and a tentative penalty parameter schedule for adjustment and control. Simulation results demonstrate that the proposed method leads to faster convergence and better pattern fidelity.
源掩膜优化(SMO)是一种在光学光刻中获得足够工艺稳定性的强大且有效的技术,特别是考虑到与22纳米及更先进工艺技术相关的挑战时。然而,SMO算法通常涉及计算密集型的非线性优化。在这项工作中,开发了一种基于增广拉格朗日方法(ALM)的快速算法来求解SMO。我们首先通过变量分裂将优化问题转换为具有约束的等效问题,然后应用交替最小化方法,该方法给出了算法的直接实现。我们还使用拟牛顿法来处理子问题以加速收敛,并采用试探性惩罚参数调度进行调整和控制。仿真结果表明,所提出的方法导致更快的收敛速度和更好的图案保真度。