Han Dandan, Deng Sen, Ye Tianchun, Wei Yayi
University of Chinese Academy of Sciences, School of Integrated Circuits, Beijing, 100049 China.
Chinese Academy of Sciences, Institute of Microelectronics, Beijing, 100029 China.
Microsyst Nanoeng. 2023 Mar 30;9:40. doi: 10.1038/s41378-023-00512-4. eCollection 2023.
Plasmonic lithography, which uses the evanescent electromagnetic (EM) fields to generate image beyond the diffraction limit, has been successfully demonstrated as an alternative lithographic technology for creating sub-10 nm patterns. However, the obtained photoresist pattern contour in general exhibits a very poor fidelity due to the near-field optical proximity effect (OPE), which is far below the minimum requirement for nanofabrication. Understanding the near-field OPE formation mechanism is important to minimize its impact on nanodevice fabrication and improve its lithographic performance. In this work, a point-spread function (PSF) generated by a plasmonic bowtie-shaped nanoaperture (BNA) is employed to quantify the photon-beam deposited energy in the near-field patterning process. The achievable resolution of plasmonic lithography has successfully been enhanced to approximately 4 nm with numerical simulations. A field enhancement factor () as a function of gap size is defined to quantitatively evaluate the strong near-field enhancement effect excited by a plasmonic BNA, which also reveals that the high enhancement of the evanescent field is due to the strong resonant coupling between the plasmonic waveguide and the surface plasmon waves (SPWs). However, based on an investigation of the physical origin of the near-field OPE, and the theoretical calculations and simulation results indicate that the evanescent-field-induced rapid loss of high- information is one of the main optical contributors to the near-field OPE. Furthermore, an analytic formula is introduced to quantitatively analyze the effect of the rapidly decaying feature of the evanescent field on the final exposure pattern profile. Notably, a fast and effective optimization method based on the compensation principle of the exposure dose is proposed to reduce the pattern distortion by modulating the exposure map with dose leveling. The proposed pattern quality enhancement method can open new possibilities in the manufacture of nanostructures with ultrahigh pattern quality via plasmonic lithography, which would find potentially promising applications in high density optical storage, biosensors, and plasmonic nanofocusing.
表面等离子体光刻技术利用倏逝电磁场生成超越衍射极限的图像,已成功被证明是一种用于制造亚10纳米图案的替代光刻技术。然而,由于近场光学邻近效应(OPE),所获得的光刻胶图案轮廓通常保真度很差,远低于纳米制造的最低要求。了解近场OPE形成机制对于最小化其对纳米器件制造的影响并提高其光刻性能很重要。在这项工作中,采用由表面等离子体蝴蝶结形纳米孔(BNA)产生的点扩散函数(PSF)来量化近场图案化过程中光子束沉积的能量。通过数值模拟,表面等离子体光刻技术可实现的分辨率已成功提高到约4纳米。定义了作为间隙尺寸函数的场增强因子(),以定量评估表面等离子体BNA激发的强近场增强效应,这也表明倏逝场的高增强是由于表面等离子体波导与表面等离子体波(SPW)之间的强共振耦合。然而,基于对近场OPE物理起源的研究,理论计算和模拟结果表明,倏逝场引起的高信息快速损失是近场OPE的主要光学贡献之一。此外,引入了一个解析公式来定量分析倏逝场的快速衰减特性对最终曝光图案轮廓的影响。值得注意的是,提出了一种基于曝光剂量补偿原理的快速有效优化方法,通过剂量均衡调制曝光图来减少图案失真。所提出的图案质量增强方法可以为通过表面等离子体光刻制造具有超高图案质量的纳米结构开辟新的可能性,这将在高密度光存储、生物传感器和表面等离子体纳米聚焦中找到潜在的应用前景。