Prajapati Chandravati, Ranganathan Dilip, Joseph Joby
Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India.
J Opt Soc Am A Opt Image Sci Vis. 2013 Apr 1;30(4):741-8. doi: 10.1364/JOSAA.30.000741.
We propose and demonstrate an interferometric method to measure the Goos-Hänchen (GH) shift, which is based on observing the interference between p- and s-polarized beams. In our method both p- and s-polarized beams are observed simultaneously and across the entire beam profile. To demonstrate our method, we measured the GH shift of aluminum (Al) and glass at different values of the incidence angle ranging from 20° to 70°, with a helium-neon laser as source. We compared the experimental result with theoretical calculations and found a good agreement between them. Our method also enables us to measure the GH shift at any point across the entire beam profile, for arbitrary beam profiles. This is not possible with the methods currently in use. We presented the observed values for the Gaussian mode used, which enables us to find the relative shifts between the p and s components at various points on the incident profile after reflection.
我们提出并演示了一种用于测量古斯-汉欣（GH）位移的干涉测量方法，该方法基于观察p偏振光和s偏振光之间的干涉。在我们的方法中，p偏振光和s偏振光在整个光束轮廓上同时被观测。为了演示我们的方法，我们以氦氖激光作为光源，在20°至70°的不同入射角下测量了铝（Al）和玻璃的GH位移。我们将实验结果与理论计算进行了比较，发现二者吻合良好。我们的方法还使我们能够针对任意光束轮廓，测量整个光束轮廓上任意点的GH位移。这是目前使用的方法所无法做到的。我们给出了所使用的高斯模式的观测值，这使我们能够找到反射后入射轮廓上各点处p分量和s分量之间的相对位移。
