State Key Laboratory for Advanced Metals and Materials, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, People's Republic of China.
Nanoscale. 2013 Jul 7;5(13):5981-5. doi: 10.1039/c3nr34247f. Epub 2013 May 28.
Single ZnO nanotetrapod-based sensors for monitoring localized UV irradiation were constructed with ohmic and Schottky contact characteristics. Localized UV irradiation at the third leg of the tetrapod was monitored by measuring the sensor's current response. Measurements of I-V performances and time-resolved current were conducted. The results demonstrate that localized UV irradiation can be detected in real time as electrical transport properties can be modulated by localized UV irradiation, and the higher the UV light power density gets, the larger the current response becomes, which is observed to be completely repeatable and reversible. Additionally, Schottky-contact type sensors clearly show a greater current response than ohmic-contact-type sensors, which further proved that Schottky-contact-type sensors are a better choice for detection in an irradiation environment. Two possible explanations are given for the phenomenon, including an electron transfer effect and a surface/interface effect on the band structure. The as-constructed sensors exhibit different sensitivities towards irradiation with various power densities, indicating that ZnO nanotetrapod-based sensors can be a promising candidate for detection in many areas including electron irradiation detection, ultraviolet irradiation monitoring, strain sensing, and complicated microenvironment observations such as biological cell inspection.
基于单个 ZnO 纳米四脚架的传感器具有欧姆和肖特基接触特性,可用于监测局部紫外光照射。通过测量传感器的电流响应来监测四脚架第三支腿处的局部紫外光照射。进行了 I-V 性能和时间分辨电流的测量。结果表明,局部紫外光照射可以实时检测到,因为局部紫外光照射可以调制电输运性质,并且光功率密度越高,电流响应越大,这是完全可重复和可逆的。此外,肖特基接触型传感器的电流响应明显大于欧姆接触型传感器,这进一步证明肖特基接触型传感器是在辐照环境下进行检测的更好选择。对于这种现象给出了两种可能的解释,包括电子转移效应和能带结构的表面/界面效应。所构建的传感器对不同功率密度的辐照表现出不同的灵敏度,这表明基于 ZnO 纳米四脚架的传感器可以成为电子辐照检测、紫外光监测、应变传感以及生物细胞检测等复杂微环境观察等许多领域检测的有前途的候选者。