Department of Mechanical Engineering, University of Washington, Seattle, WA 98195-2600, USA.
Nanoscale. 2013 Jul 7;5(13):5747-51. doi: 10.1039/c3nr00770g. Epub 2013 May 29.
Accurate scanning probing of magnetic materials at the nanoscale is essential for developing and characterizing magnetic nanostructures, yet quantitative analysis is difficult using the state of the art magnetic force microscopy, and has limited spatial resolution and sensitivity. In this communication, we develop a novel piezomagnetic force microscopy (PmFM) technique, with the imaging principle based on the detection of magnetostrictive response excited by an external magnetic field. In combination with the dual AC resonance tracking (DART) technique, the contact stiffness and energy dissipation of the samples can be simultaneously mapped along with the PmFM phase and amplitude, enabling quantitative probing of magnetic materials and structures at the nanoscale with high sensitivity and spatial resolution. PmFM has been applied to probe magnetic soft discs and cobalt ferrite thin films, demonstrating it as a powerful tool for a wide range of magnetic materials.
准确地在纳米尺度下扫描探测磁性材料对于开发和表征磁性纳米结构至关重要，然而，最先进的磁力显微镜在进行定量分析时存在困难，且其空间分辨率和灵敏度有限。在本通讯中，我们开发了一种新颖的压磁力显微镜（PmFM）技术，其成像原理基于检测外部磁场激发的磁致伸缩响应。结合双交流共振跟踪（DART）技术，可同时对样品的接触刚度和能量耗散以及 PmFM 的相位和幅度进行映射，从而实现对磁性材料和结构的纳米尺度高灵敏度和高空间分辨率的定量探测。我们已经应用 PmFM 来探测磁性软磁盘和钴铁氧体薄膜，证明其是一种用于广泛磁性材料的强大工具。
