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化合物 X 射线探测器材料能量吸收响应函数的解析模型。

Analytic model of energy-absorption response functions in compound X-ray detector materials.

出版信息

IEEE Trans Med Imaging. 2013 Oct;32(10):1819-28. doi: 10.1109/TMI.2013.2265806. Epub 2013 Jun 3.

Abstract

The absorbed energy distribution (AED) in X-ray imaging detectors is an important factor that affects both energy resolution and image quality through the Swank factor and detective quantum efficiency. In the diagnostic energy range (20-140 keV), escape of characteristic photons following photoelectric absorption and Compton scatter photons are primary sources of absorbed-energy dispersion in X-ray detectors. In this paper, we describe the development of an analytic model of the AED in compound X-ray detector materials, based on the cascaded-systems approach, that includes the effects of escape and reabsorption of characteristic and Compton-scatter photons. We derive analytic expressions for both semi-infinite slab and pixel geometries and validate our approach by Monte Carlo simulations. The analytic model provides the energy-dependent X-ray response function of arbitrary compound materials without time-consuming Monte Carlo simulations. We believe this model will be useful for correcting spectral distortion artifacts commonly observed in photon-counting applications and optimal design and development of novel X-ray detectors.

摘要

X 射线成像探测器中的吸收能量分布(AED)是通过 Swank 因子和探测量子效率影响能量分辨率和图像质量的一个重要因素。在诊断能区(20-140keV),光电吸收和康普顿散射光子的特征光子逃逸是 X 射线探测器中吸收能量弥散的主要来源。在本文中,我们描述了一种基于级联系统方法的复合 X 射线探测器材料 AED 的解析模型的开发,该方法包括特征和康普顿散射光子的逃逸和再吸收的影响。我们为半无限平板和像素两种几何形状推导出了解析表达式,并通过蒙特卡罗模拟验证了我们的方法。该解析模型提供了任意复合材料的能量相关 X 射线响应函数,而无需进行耗时的蒙特卡罗模拟。我们相信,该模型将有助于纠正光子计数应用中常见的谱失真伪影,并对新型 X 射线探测器进行最佳设计和开发。

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